CITC’s infrastructure expanded with confocal scanning acoustic microscope

CITC’s lab has been expanded with a confocal scanning acoustic microscope (CSAM) from acoustic microscopy expert PVA TePla. The microscope provides non-destructive quality control capabilities. It will therefore allow CITC to assess the reliability of the sinter die attachment to the leadframe.

Read more: https://ap.lc/vcQKq
Watch a video of the CSAM: https://ap.lc/j1KYC