Date: Thursday November 13th, 2025
Time: 11:30 – 13:15 (Lunch included)
Location: Noviotech Campus, Building M, Meet&Greet
When a chip fails, you want to know why and more importantly, how to prevent it.
In this focused workshop at Noviotech Campus, you’ll join fellow engineers and researchers from Radboud University to take a closer look at how and why semiconductor devices fail and which analytical techniques can help you uncover the root causes.
You’ll explore advanced optical methods such as OBIRCH, as well as new benchmarking infrastructures like MUSICA, which bring chip testing and comparison to a new level. Prof. Aleksei Kimel and Dr. Jeroen Jansen will share recent research findings, technical challenges, and practical approaches from their ongoing work at Radboud University.
What to Expect
- Technical Deep Dive
Gain a detailed understanding of modern techniques for detecting and analyzing defects in increasingly complex chips. You’ll learn about spectral imaging, time-resolved optical beam-induced resistance change, and other advanced methods used to study failure mechanisms at the nanoscale. - Interactive Sessions
Bring your own examples and real-world challenges. This session is built for knowledge exchange — not just listening. You’ll have the chance to share experiences, ask technical questions, and shape the discussion. - Collaboration Opportunities
Explore how companies at Noviotech Campus can collaborate with Radboud University’s failure analysis research team — from access to specialized labs and measurement equipment to joint research initiatives.
Who Should Join
This workshop is designed for engineers, R&D specialists, and technical leads in the semiconductor and chip industry working on quality assurance, product reliability, testing, and failure analysis. Professionals from related technical fields with an interest in advanced diagnostic methods are also welcome.
Why Attend
- Deepen your understanding of state-of-the-art failure analysis technologies.
- Exchange insights and experiences with peers from engineering, R&D, and academia.
- Learn how to leverage Radboud University’s research expertise and lab infrastructure.
The session is compact, content-driven, and designed for meaningful technical exchange.
Lunch will be provided.
Program
11:30 – 11:45 Walk-in & registration
11:45 – 12:45 Deep Dive in Failure Analysis in Semiconductor Chips with Prof. Aleksei Kimel and Dr. Jeroen Jansen (Radboud University)
12:45 – 12:50 Q&A and Wrap-up
12:50 – 13:15 Lunch & knowledge exchange
Take this opportunity to deepen your technical understanding, share real-world experience, and connect with experts tackling one of the most complex challenges in semiconductor engineering.
